Electrical Investigation on Nanometer-Scale Structures with Dynamic XPS

The central interest of this work is development of a new method and approach to survey electrical nature of surface structures and composite materials, which include thin polymeric films and functionalized SAMs. The main characterization technique is based on both externally biased and pulsed XPS, and the modeling experiment condition in view of major factors to extract worthwhile information from samples. Addition to a good agreement between experimental and theoretical results, the method provides detailed outcome of the electrical nature, such as effective resistance and capacitance values not in a conventionally limited depth profile length of XPS, but the full profile of sample, so it is a versatile technique and can be further diversified in accordance with our imaginations.