SPM

WHAT IS SPM ?

Scanning Probe Microscopy (SPM) is a technique that is used to study the properties of surfaces at the atomic level. A Scanning Probe Microscope scans an atomically sharp probe over a surface, typically at a distance of a few angstroms or nanometers. The interaction between the sharp probe and surface provides 3-D topographic image of surface at the atomic scale. The modes are the most popular in Scanning Probe Microscopy: Hall-probe microscopy, Atomic Force Microscopy (AFM) Scanning Tunneling Microscopy (STM) Bilkent SPM group is mainly focused on AFM and Hall-probe microscopy research.(click for more information)

 

AFM

 

 

WHAT IS AFM ?

The atomic force microscope (AFM) was originally devised as an analog of the scanning tunneling microscope (STM), using forces rather than the tunnel current between tip and surface atoms to generate atomic resolution images. Forces associated with short-range bonding have, like the tunnel current, an exponential dependence on distance making atomic resolution possible. (click for more information)

 

SHPM

 

 

WHAT IS SHPM ?

A fundamental understanding of the behavior of magnetic domains in external magnetic fields is important for the development of ultrahigh-density magnetic recording media, high coercivity permanent magnets and multilayered ferromagnetic structures. Scanning Hall probe microscopy is a promising method for the non-invasive and direct imaging of magnetic domains. (click for more information)
 

 

PUBLICATIONS
2004

Direct measurement of molecular stiffness and damping in confined water layers

 

Nano and micro Hall-effect sensors for Room-Temperature Scanning Hall Probe Microscopy
 

Low-amplitude, force gradient imaging of Cu(100) surface using tunnel current feedback
 

50nm Hall Sensors for Room Temperature Scanning Hall Probe Microscopy
       
2003 Integrated Piezoresistive Sensors for Atomic Force - Guided Scanning Hall Probe Microscopy
 

Room Temperature  Scanning Micro-Hall Probe Microscopy under Extremely Large Pulsed Magnetic Fields
  High-sensitivity noncontact atomic force microscope/scanning tunnelling microscope (nc-AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy         
 

Measurement of Energy dissipation between Tungsten tip and Si(100)-(21) using sub-Angstrom oscillation amplitude non-contact Atomic Force Microscope (nc-AFM)
  Micromachined III-V cantilevers for AFM-tracking scanning Hall probe microscopy
       
2002

Room Temperature Scanning Micro-Hall Probe Microscope Imaging of  Ferromagnetic Microstructures in the Presence of 2.5 Tesla Pulsed Magnetic Fields Generated by an Integrated Mini Coil
 

Ultra-small oscillation amplitude nc-AFM/STM  imaging, force and dissipation spectroscopy of Si(100)(2´1)
  Room Temperature Scanning Hall Probe Microscope (RT_SHPM) Imaging of Garnet Films Using New High Performance InSb Sensors
 

Room temperature scanning Hall probe microscopy using GaAs / AlGaAs and Bi micro-Hall probes
 

Room temperature scanning Hall probe microscopy of localized magnetic field fluctuations on the surfaces of magnetic recording media, permanent magnets and crystalline garnet films in external bias fields
  Simultaneous non-contact Atomic force microscopy (nc-AFM)/STM Imaging and Force Spectroscopy of Si(001)(2x1) with small oscillation amplitudes
       
2001 Energy Dissipation in Atomic Force Microscopy and Atomic Loss Processes
 

Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy
  Quantitative atom-resolved force gradient imaging using non contact atomic force microscopy
  Room Temperature Magnetic Imaging of Magnetic Storage media and Garnet  Epilayers in the Presence of External Magnetic Fields using a sub-micron GaAs SHPM
  Room Temperature Sub-Micron Magnetic Imaging by Scanning Hall probe Microscopy
 

Direct Magnetic Imaging of Ferromagnetic Domain Structures by Room Temperature Scanning Hall Probe Microscopy Using a Bismuth Micro-Hall Probe
  Direct measurement of interatomic force gradients using an ultra-low amplitude atomic force   microscope
       
2000 Collective modes in flux line liquids.
  Quantitative Electrostatic Force Measurement in AFM
  Manipulation of atoms across a surface at room temperature
       
1999 Direct observation of vortex lattice melting in Bi2Sr2CaCu2O8+d single crystals
  Interaction of bromine with Ni(110) studied by scanning tunnelling microscopy
  Scanning Hall probe microscopy of ferromagnetic structures
       
1998 Microscopes get to the point
  Direct Observation of Melting of the Vortex Solid in Bi2Sr2CaCu2O8+d  Single Crystals
       
1997

Disorder-driven “Intermediate” State in the Lattice Melting Transition of Bi2Sr2CaCu2O8+d Single Crystals
  Hall Effect in a highly inhomogeneous Magnetic Field Distribution
 

Microscopic Measurement of Penetration depth in YBa2Cu3O7-d Thin Films by Scanning Hall Probe Microscopy
       
1996 Vortex imaging in superconducting films by Scanning Hall Probe Microscopy
  Real-time Scanning Hall Probe Microscopy
  Scanning Hall Probe Microscopy of Superconductors and Magnetic Materials
       
1995 Initial stages of SiGe epitaxy on Si(001) studied by scanning tunnelling microscopy
       
1993 A Novel Force Microscope and Point Contact Probe
  STM of Glow Discharge Treated Surfaces