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Şefik Süzer

Şefik Süzer

office SB-126
phone (90-312) 266 14 76
fax (90-312) 266 40 68
e-mail
web
www.fen.bilkent.edu.tr/~suzer

Professor
Department Head

Ph.D., Chemistry, University of California, Berkeley, 1976. Electron, ion and photon spectroscopic analyses of gases, solids and surfaces.

Physical Chemistry
Electron, ion and photon spectroscopic analyses of gases, solids and surfaces.

Representative Publications

- “XPS analysis with external bias: A simple method for probing differential charging”, G. Ertas and S. Suzer, Surface and Interface Analysis (in print, 2004).
- “Time-resolved XPS in the Milisecond Range” U.K. Demirok, G. Ertas and S. Suzer, Journal of Physical Chemsitry B 108, 5179-81 (2004). 
- “Differential Charging in SiO2/Si System as determined by XPS”, F. Karadas, S. Suzer, J. Phys. Chem. B 108, 1515-1518 (2004).
- “Differential Charging in XPS; A Nuisance or a Useful Tool?“ S. Suzer, Analytical Chemistry 75, 7026-29 (2003).
- “X-ray Photoemission Studies of Alkylsilane Based Monolayers on Gold”, T. M. Owens, S. Suzer, and M.M. Banaszak Holl, J. Phys. Chem. B 107, 3177-3182 (2003).
- “XPS Studies of SiO2/Si System under External Bias”, B. Ulgut, and S. Suzer, J. Phys. Chem. B 107, 2939-43 (2003).
- “Soft X-ray Photoemeission Stdies of Hf Oxidation”, S. Suzer, S. Sayan, M.M. Banaszak Holl, E. Garfunkel, Z. Hussain, and N.M. Hamdan, Journal of Vacuum Science and Technology A 21, 106-109 (2003).
- “Formation of Alkylsilane Based Monolayers on Gold”, T.M. Owens, K.T. Nicholson, M.M. Banaszak Holl, and S. Suzer, Journal of American Chemical Society, 124, 6800-6801 (2002).
- “Soft X-ray Photoemission Studies of the HfO2/SiO2/Si System”, S. Sayan, E. Garfunkel, and S. Suzer, Applied Physics Letters, 80, 2135-37 (2002).
- “Deposition and Stability of Metal Ions on Oxidized Silicon Surfaces: Electrochemical Correlation” 
S. Suzer , Journal of Electron Spectroscopy and Rel. Phen. 114-116, 1151-1154 (2001).
- “UV-Induced Acid-Base Chemistry within the PVC Matrix”, O. Birer and S. Suzer, Polymer 42, 1833-35 (2001).
- “XPS Investigation of X-Ray Induced Reduction of Metal Ions”, S. Suzer, Applied Spectroscopy 54, 1716-18 (2000).
- “Doping of 2-Cl-PANI/PVC by Exposure to UV, g-rays and e-Beams”, U.A. Sevil, O. Guven, O. Birer and S. Suzer, Synthetic Metals 110, 175-179 (2000).
- “XPS and Water Contact Angle Measurements on Aged and Corona-Treared PP”, S. Suzer, A. Argun, O. Vatansever and O. Aral, J. Appl. Polm. Sci. 74, 1846-50 (1999).
- "X-ray Photoelectron Spectroscopic Charecterization of Au, Bi and Mn Collected on Atom Trapping Silica for AAS", S. Suzer, N. Ertas, S. Kumser and O.Y. Ataman, Applied Spectroscopy, 53, 479-482 (1999).
- "Spectroscopic Investigation of Onset and Enhancement of Electrical Conductivity in PVC/PANI Composites and Blends by g-Ray or UV Irradiation", U.A. Sevil, O. Güven ans S. Suzer, J. Phys. Chem B 102, 3902-3905 (1998).
- "Surface Characterization of the Hydroxy Terminated Poly(-Caprolactone)/Poly(Dimethylsiloxane) Triblock Copolymers by ESCA and Contact Angle Measurements" H.Y. Erbil, B. Yasar, S. Suzer, B.B. Baysal, Langmuir 13, 5484-5493 (1997).